E M 086M Focused Ion Beam (FIB) Operation and Atomic Force Microscopy (AFM
Units: 2 Prerequisites: E M 074 Scanning Electron Microscopy with a grade of “C” or better. Prerequisite Skills: 1. Advisory: Reading Level II. This course is an advanced microscopy lecture and laboratory course specifically dealing with the alignment and operation of the focused ion beam (FIB) instrument and the atomic force microscope.