2018-2019 San Joaquin Delta College Catalog 
    
    Jan 23, 2021  
2018-2019 San Joaquin Delta College Catalog [ARCHIVED CATALOG]

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E M 086M Focused Ion Beam (FIB) Operation and Atomic Force Microscopy (AFM


Units: 2
Prerequisites: E M 074 Scanning Electron Microscopy  with a grade of “C” or better.
Prerequisite Skills: 1. Advisory: Reading Level II.
This course is an advanced microscopy lecture and laboratory course specifically dealing with the alignment and operation of the focused ion beam (FIB) instrument and the atomic force microscope.



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