E M 86M Focused Ion Beam (FIB) Operation and Atomic Force Microscopy (AFM

Units: 2
Prerequisites: E M 74 Scanning Electron Microscopy with a grade of “C” or better.
Advisories: Ability to read at the 12th grade level.
This course is an advanced microscopy lecture and laboratory course specifically dealing with the alignment and operation of the focused ion beam (FIB) instrument and the atomic force microscope.