Mar 10, 2026  
2019-2020 San Joaquin Delta College Catalog 
    
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2019-2020 San Joaquin Delta College Catalog [ARCHIVED CATALOG]

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E M 86M Focused Ion Beam (FIB) Operation and Atomic Force Microscopy (AFM

Units: 2
Prerequisites: E M 74 Scanning Electron Microscopy  with a grade of “C” or better.
Advisories: Ability to read at the 12th grade level.
This course is an advanced microscopy lecture and laboratory course specifically dealing with the alignment and operation of the focused ion beam (FIB) instrument and the atomic force microscope.


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